Profile analysis
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Profile analysis
Profile analysis
Equipment :
Atomic force microscope : Bruker Dimension Icon, with options PeakForce QNM and Nano-DMA.
Profilometer : Bruker DektakXT
Optical microscope : Zeiss Axio Imager M1m
NanoSaintÉtienne
Gratings elaboration
Thin film deposition
Processing substrates
Profile analysis
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PETRA - Radiative Tests
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Electron microscopy
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Femtosecond laser
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Primitives Characterization
SCA and Attack
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Laser Injection
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